AFL Blog

Product Registration of Test Equipment – It is important!

No matter what you purchase these days, manufacturers include product registration cards. Even inexpensive consumer products like Bluetooth head phones and toasters come with product registration cards. 

The Path to 100G Single Lambda in the Data Center - Part 5

There has been great deal of activity in the electro-optic component and subsystem segments relating to this next generation leap forward – turns out that 100G single lambda is a super-hot topic in Fall 2017. As the EO components are enabling ingredients in next gen 100G single lambda transceivers, assessing commercial status is worthwhile in terms of helping to predict system-level timelines for this exciting technology.

The Path to 100G Single Lambda in the Data Center - Part 4

This is part four on the technical and business trends driving the path to 100G single lambda in the data center.

The Path to 100G Single Lambda in the Data Center - Part 3

The technical and commercial dynamics that will lead the semiconductor and electro-optical components industries to enable ubiquitous 100G single lambda system designs over the next several years.

New Product Details Page

We have redesigned our product details page for easy of use for both desktop and mobile visitors.

The Path to 100G Single Lambda in the Data Center - Part 2

While not definitional, in end-to-end 25G single lambda signal chains, the electrical SerDes rate in the chip-to-module interface between the switch ASIC and the pluggable transceiver also runs at 25 Gbps (or 28 Gbps to account for 64B/66B encoding and FEC overhead when used).

The Path to 100G Single Lambda in the Data Center - Part 1

It is pretty widely acknowledged that 2016/2017 is prime time for 100 Gbps short reach optical links in the data center, interconnecting servers and switches.

Dean Yamasaki to present at SPIE Symposium

Dean Yamasaki, Product Line Specialty Cable Manager, is presenting at a SPIE symposium.

5 Best Practices for Certifying Next Generation Networks: A Suitable Test Reference Method

To assure the most accurate loss measurements when testing a link, the use of Reference Grade cables during the referencing process is critical to ensure accuracy, repeatability and reproducibility.

5 Best Practices for Certifying Next Generation Networks: Bi-Directional Measurements

While a single direction loss measurement method is initially quicker and cheaper, a bi-directional method is preferable for more reliable overall network characterization, since it significantly reduces the likelihood of rework and associated costs.